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Scanning confocal Raman spectrometer with atomic force microscope / near-field scanning optical microscope

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000139-b6b4-1496-9dbb-bb2180000000

Resource Type

  1. Raman-Atomic force microscope

Properties

  1. Resource Description
    Atomic force microscope attached to 532 nm and 660 nm laser sources and confocal Raman spectroscopy system. Spatial resolution is about 300 nm. Two full-featured microscopes allow imaging of both opaque and transparent samples. The inverted microscope system has an oil immersion lens and high numerical aperture for high-resolution optical imaging. Near-field scanning optical microscopy (NSOM) and photomultiplier tube yield ~100 nm optical resolution. The raman spectrometer has edge and notch filters and a full complement of diffraction gratings. The high-resolution CCD camera is cooled for noise reduction. Various types of systems can be investigated with this instrument: • graphene, carbon nanotubes and other carbon materials • semiconductor devices • nanotubes, nanowires, and quantum dots • polymers • optical devices such as semiconductor lasers, waveguides, and plasmonic devices Investigation of cellular tissue, DNA, viruses and other biological objects and in situ temperature measurements can be carried out.
  2. Additional Name
    AFM/NSOM Raman microscope
  3. Contact
    Brukman, Matt, Ph.D.
  4. Manufacturer
    NT-MDT
  5. Website(s)
    http://www.nanotech.upenn.edu/instrumentation.html
  6. Related Technique
    Atomic force microscopy
  7. Related Technique
    Material surface analysis
  8. Related Technique
    Imaging technique
  9. Related Technique
    Raman spectroscopy
  10. Location
    NBIC Probe Facility (Penn)
 
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Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016