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Bruker Dimension Icon AFM

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000139-b6c4-d9f0-9dbb-bb2180000000

Resource Type

  1. Atomic force microscope

Properties

  1. Resource Description
    "Ambient AFM with large (100 μm) scanner, 4-inch sample stage, and closed-loop scanner. Environmental hood for inert gas DC and AC electrical modulation of tip or sample stage. Capabilities include: • Lateral and piezo force microscopy. • Tapping and torsional-resonance AFM. • Scanning surface potential, scanning conductivity, and tunneling microscopy. • PeakForce AFM with quantiative nanomechanics, including PeakForce conductive AFM.
  2. Manufacturer
    Veeco Instruments Inc.
  3. Website(s)
    http://www.nanotech.upenn.edu/instrumentation.html
  4. Related Technique
    Atomic force microscopy
  5. Related Technique
    Material surface analysis
  6. Location
    NBIC Probe Facility (Penn)
 
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Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016