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Bruker Dimension Icon AFM

eagle-i ID


Resource Type

  1. Atomic force microscope


  1. Resource Description
    "Ambient AFM with large (100 μm) scanner, 4-inch sample stage, and closed-loop scanner. Environmental hood for inert gas DC and AC electrical modulation of tip or sample stage. Capabilities include: • Lateral and piezo force microscopy. • Tapping and torsional-resonance AFM. • Scanning surface potential, scanning conductivity, and tunneling microscopy. • PeakForce AFM with quantiative nanomechanics, including PeakForce conductive AFM.
  2. Manufacturer
    Veeco Instruments Inc.
  3. Website(s)
  4. Related Technique
    Atomic force microscopy
  5. Related Technique
    Material surface analysis
  6. Location
    NBIC Probe Facility (Penn)
Provenance Metadata About This Resource Record
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016