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Agilent PicoPlus atomic force microscope

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000139-b6de-26e4-9dbb-bb2180000000

Resource Type

  1. Atomic force microscope

Properties

  1. Resource Description
    Multi-environment AFM: Ambient, fluid cell, controlled gas. Tip-bias control and built-in lock-ins electrical excitation • contact and dynamic scanning modes. • electric force microscopy (EFM), scanning kelvin probe microscopy (SKPM) higher harmonic imaging. • MAC mode for dynamic actuation in fluids. • closed-loop and open loop scanners with 10μm & 100 μm range.
  2. Additional Name
    Molecular Imaging AFM
  3. Contact
    Brukman, Matt, Ph.D.
  4. Manufacturer
    Agilent Technologies
  5. Website(s)
    http://www.nanotech.upenn.edu/instrumentation.html
  6. Related Technique
    Atomic force microscopy
  7. Location
    NBIC Probe Facility (Penn)
 
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Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016