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Agilent PicoPlus atomic force microscope

eagle-i ID


Resource Type

  1. Atomic force microscope


  1. Resource Description
    Multi-environment AFM: Ambient, fluid cell, controlled gas. Tip-bias control and built-in lock-ins electrical excitation • contact and dynamic scanning modes. • electric force microscopy (EFM), scanning kelvin probe microscopy (SKPM) higher harmonic imaging. • MAC mode for dynamic actuation in fluids. • closed-loop and open loop scanners with 10μm & 100 μm range.
  2. Additional Name
    Molecular Imaging AFM
  3. Contact
    Brukman, Matt., PhD
  4. Manufacturer
    Agilent Technologies
  5. Website(s)
  6. Related Technique
    Atomic force microscopy
  7. Location
    NBIC Probe Facility (Penn)
Provenance Metadata About This Resource Record
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016