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Omicron VT-STM/AFM

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000139-b6e9-bfb5-9dbb-bb2180000000

Resource Type

  1. Scanning force microscope

Properties

  1. Resource Description
    This ultra-high vacuum atomic force / scanning tunneling microscope overs a temperature range from 25 K to 1500 K with a scan range of 10 μm × 10 μm × 1.5 μm. Operation modes include contact mode with normal force/lateral force detection and non-contact modes (i.e. NC-AFM, SKPM, EFM, MFM). The VT AFM also includes STM detection with the first I/V conversion stage in-situ, located close to the scanner in order to achieve best signal-to-noise ratio and optimal performance. <b>STM capabilities</b> • Bias: tip • Bias range: ±10 V • Measurable tunneling current: 100 pA - 10 nA • Spectroscopy options: I/V, dI/dV, CITS
  2. Additional Name
    Omicron VT SPM
  3. Contact
    Brukman, Matt, Ph.D.
  4. Manufacturer
    Omicron
  5. Website(s)
    http://www.nanotech.upenn.edu/facilities_images/Edison-UHV.pdf
  6. Website(s)
    http://www.omicron.de/en/products/variable-temperature-spm/variants
  7. Related Technique
    Atomic force microscopy
  8. Related Technique
    Scanning probe microscopy
  9. Location
    NBIC Probe Facility (Penn)
 
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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016