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Oxford ultra-high vacuum scanning tunneling microscope with RHK Controller

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000139-b6fb-402f-9dbb-bb2180000000

Resource Type

  1. Scanning force microscope

Properties

  1. Resource Description
    Oxford UHV chamber is paired with an RHK controller. STM capabilities • Bias: sample • Bias range: ±10 V • Measurable tunneling current: 100 pA - 100 nA • Amplifier bandwidth: 500 Hz - 150 kHz • Spectroscopy options: I/V, dI/dV, CITS
  2. Additional Name
    Oxford UHV STM with RHK Controller
  3. Manufacturer
    Oxford Applied Research
  4. Manufacturer
    RHK Technology, Inc.
  5. Website(s)
    http://www.nanotech.upenn.edu/facilities_images/Edison-UHV.pdf
  6. Related Technique
    Auger electron spectroscopy
  7. Related Technique
    Scanning probe microscopy
  8. Location
    NBIC Probe Facility (Penn)
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    fcoldren
  3. created
    2012-09-11T15:18:56.650-05:00
  4. creator
    fcoldren
  5. modified
    2012-11-08T11:24:15.358-05:00

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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016