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Interfacial force microscope

eagle-i ID


Resource Type

  1. Scanning force microscope


  1. Resource Description
    Adhesion and friction measurements (sensitivity 10 nN-20 uN) are made using displacement control. Unique feature: A novel electrostatically-driven & self-balancing sensor, which has zero compliance. In contrast to nanoindentors and AFMs, there is no snap-in to contact.
  2. Contact
    Brukman, Matt., PhD
  3. Website(s)
  4. Location
    NBIC Probe Facility (Penn)
Provenance Metadata About This Resource Record
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016