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JEOL 7500F HRSEM

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000140-2b32-8761-6ba0-cf2f80000000

Resource Type

  1. Scanning electron microscope

Properties

  1. Resource Description
    "The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating."
  2. Manufacturer
    JEOL Ltd.
  3. Model Number
    7500F
  4. Website(s)
    http://www.seas.upenn.edu/nanotechfacility/em/jeol7500f.html
  5. Related Technique
    Scanning electron microscopy
  6. Location
    Nanoscale Characterization
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    ggrant (Gregory Grant)
  3. created
    2013-07-29T12:13:05.769-04:00
  4. creator
    fcoldren
  5. modified
    2020-02-13T14:34:52.767-05:00
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