JEOL 7500F HRSEM

eagle-i ID

Resource Type

Properties

1. Resource Description

   "The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating."

2. Manufacturer

   JEOL Ltd.

3. Model Number

   7500F

4. Website(s)

   http://www.seas.upenn.edu/nanotechfacility/em/jeol7500f.html

5. Related Technique

   Scanning electron microscopy

6. Location

   Nanoscale Characterization