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JEOL 7500F HRSEM

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000140-2b32-8761-6ba0-cf2f80000000

Resource Type

  1. Scanning electron microscope

Properties

  1. Resource Description
    "The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating."
  2. Manufacturer
    0000013d-bc77-5da0-ecc6-81a580000000
  3. Model Number
    7500F
  4. Website(s)
    http://www.seas.upenn.edu/nanotechfacility/em/jeol7500f.html
  5. Related Technique
    Scanning electron microscopy
  6. Location
    Nanoscale Characterization
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    ggrant (Gregory Grant)
  3. created
    2013-07-29T12:13:05.769-04:00
  4. creator
    fcoldren
  5. modified
    2020-02-13T14:34:52.767-05:00
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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016