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JEOL 7500F HRSEM
eagle-i ID
http://eagle-i.itmat.upenn.edu/i/00000140-2b32-8761-6ba0-cf2f80000000
Resource Type
Properties
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Resource Description
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"The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating."
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Manufacturer
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JEOL Ltd.
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Model Number
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7500F
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Website(s)
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http://www.seas.upenn.edu/nanotechfacility/em/jeol7500f.html
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Related Technique
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Scanning electron microscopy
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Location
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Nanoscale Characterization
