JEOL 7500F HRSEM

eagle-i ID

Resource Type

Properties

1. Resource Description

   "The JEOL 7500F scanning electron microscope (SEM) is our dedicated conventional and high-resolution imaging microscope. It is equipped with a range of detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, refered to as the "gentle-beam" mode, the electron beam may be reduced to a fraction of the accelerating voltage at the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating."

2. Manufacturer

   0000013d-bc77-5da0-ecc6-81a580000000

3. Model Number

   7500F

4. Website(s)

   http://www.seas.upenn.edu/nanotechfacility/em/jeol7500f.html

5. Related Technique

   Scanning electron microscopy

6. Location

   Nanoscale Characterization