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FEI Strata DB235 focused ion beam

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000140-2b39-ab96-6ba0-cf2f80000000

Resource Type

  1. Ion source

Properties

  1. Resource Description
    "The FEI Strata DB235 Focused Ion Beam bridges the gap between nanocharacterization and nanomachining by combining a high resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling and ion-beam assisted material depostion and selective etching. Four gas injection systems will allow for platinum deposition and selective etching of carbon, metals, and oxides."
  2. Manufacturer
    FEI Company
  3. Website(s)
    http://www.seas.upenn.edu/nanotechfacility/fib/index.html
  4. Related Technique
    Material processing technique
  5. Location
    Nanoscale Characterization
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    ggrant (Gregory Grant)
  3. created
    2013-07-29T12:22:56.492-04:00
  4. creator
    fcoldren
  5. modified
    2020-02-13T14:18:45.881-05:00
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016