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FEI Strata DB235 focused ion beam

eagle-i ID


Resource Type

  1. Ion source


  1. Resource Description
    "The FEI Strata DB235 Focused Ion Beam bridges the gap between nanocharacterization and nanomachining by combining a high resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling and ion-beam assisted material depostion and selective etching. Four gas injection systems will allow for platinum deposition and selective etching of carbon, metals, and oxides."
  2. Manufacturer
    FEI Company
  3. Website(s)
  4. Related Technique
    Material processing technique
  5. Location
    Nanoscale Characterization
Provenance Metadata About This Resource Record
  1. workflow state
  2. contributor
    ggrant (Gregory Grant)
  3. created
  4. creator
  5. modified
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016