FEI Strata DB235 focused ion beam

eagle-i ID

Resource Type

Properties

1. Resource Description

   "The FEI Strata DB235 Focused Ion Beam bridges the gap between nanocharacterization and nanomachining by combining a high resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling and ion-beam assisted material depostion and selective etching. Four gas injection systems will allow for platinum deposition and selective etching of carbon, metals, and oxides."

2. Manufacturer

   FEI Company

3. Website(s)

   http://www.seas.upenn.edu/nanotechfacility/fib/index.html

4. Related Technique

   Material processing technique

5. Location

   Nanoscale Characterization