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FEI Strata DB235 focused ion beam
eagle-i ID
http://eagle-i.itmat.upenn.edu/i/00000140-2b39-ab96-6ba0-cf2f80000000
Resource Type
Properties
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Resource Description
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"The FEI Strata DB235 Focused Ion Beam bridges the gap between nanocharacterization and nanomachining by combining a high resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling and ion-beam assisted material depostion and selective etching. Four gas injection systems will allow for platinum deposition and selective etching of carbon, metals, and oxides."
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Manufacturer
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FEI Company
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Website(s)
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http://www.seas.upenn.edu/nanotechfacility/fib/index.html
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Related Technique
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Material processing technique
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Location
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Nanoscale Characterization
