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JEOL 7500F HRSEM

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000152-1370-3b37-c297-b1a480000000

Resource Type

  1. Scanning electron microscope

Properties

  1. Resource Description
    The JEOL 7500F Scanning Electron Microscope provides ultrahigh resolution of 0.8 nm at 30 kV and 1 nm at 1 kV, which is particularly useful for soft-matter studies. The JEOL 7500F SEM is our dedicated conventional and high-resolution imaging microscope. It is equipped with multiple detectors and imaging modes that allow for the study of a wide range of solid materials. Secondary and backscattered electron detectors allow for imaging of sample surfaces, whereas a scanning-transmission electron detector shows the internal structure of materials. Through a stage biasing system, referred to as the “gentle-beam” mode, the electron beam interacting with the sample may be reduced to a fraction of the accelerating voltage of the gun, allowing for the imaging of soft or insulating samples without the need for carbon or metal coating. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/7500F-300x260.jpg" alt="JEOL 7500F HRSEM">
  2. Manufacturer
    JEOL Ltd.
  3. Model Number
    7500F
  4. Website(s)
    http://www.nano.upenn.edu/resources/equipmentinstrumentation/
  5. Part of Collection
    Nanoscale Characterization Facility
  6. Location
    Singh Center for Nanotechnology (Penn)
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    fcoldren
  3. created
    2016-01-05T15:19:03.282-05:00
  4. creator
    fcoldren
  5. modified
    2016-01-05T15:28:03.953-05:00

Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016