eagle-i The University of PennsylvaniaThe University of Pennsylvania
See it in Search
This page is a preview of the following resource. Continue onto eagle-i search using the button on the right to see the full record.

J.A. Woollam V VASE Spectroscopic Ellipsometer

eagle-i ID


Resource Type

  1. Ellipsometer


  1. Resource Description
    The VASE is one of the most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range up to 300 to 1100nm. Variable wavelength and angle of incidence allow flexible measurement capabilities including: Reflection and Transmission Ellipsometry Generalized Ellipsometry Reflectance (R) intensity Transmittance (T) intensity Cross-polarized R/T Depolarization Scatterometry Mueller-matrix <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/MET-06-300x225.jpg" alt="J.A. Woollam V VASE Spectroscopic Ellipsometer">
  2. Additional Name
    JA Woollam V VASE
  3. Manufacturer
    J.A. Woollam Co. Inc.
  4. Model Number
  5. Website(s)
  6. Part of Collection
    Quattrone Nanofabrication Facility
  7. Location
    Singh Center for Nanotechnology (Penn)
Provenance Metadata About This Resource Record
  1. workflow state
  2. contributor
  3. created
  4. creator
  5. modified
Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016