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J.A. Woollam V VASE Spectroscopic Ellipsometer

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000152-3290-5aaf-aeee-612f80000000

Resource Type

  1. Ellipsometer

Properties

  1. Resource Description
    The VASE is one of the most accurate and versatile ellipsometer for research on all types of materials: semiconductors, dielectrics, polymers, metals, multi-layers, and more. It combines high accuracy and precision with a wide spectral range up to 300 to 1100nm. Variable wavelength and angle of incidence allow flexible measurement capabilities including: Reflection and Transmission Ellipsometry Generalized Ellipsometry Reflectance (R) intensity Transmittance (T) intensity Cross-polarized R/T Depolarization Scatterometry Mueller-matrix <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/MET-06-300x225.jpg" alt="J.A. Woollam V VASE Spectroscopic Ellipsometer">
  2. Additional Name
    JA Woollam V VASE
  3. Manufacturer
    J.A. Woollam Co. Inc.
  4. Model Number
    V-Vase
  5. Website(s)
    http://www.nano.upenn.edu/resources/equipmentinstrumentation/
  6. Part of Collection
    Quattrone Nanofabrication Facility
  7. Location
    Singh Center for Nanotechnology (Penn)
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    fcoldren
  3. created
    2016-01-11T16:23:10.359-05:00
  4. creator
    fcoldren
  5. modified
    2016-01-12T09:11:20.307-05:00

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