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NewView™ 7300 3D Optical Surface Profiler

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000152-3298-1ab6-aeee-612f80000000

Resource Type

  1. Profilometer

Properties

  1. Resource Description
    The NewView™ 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 10000 µm at high speeds, independent of surface texture, magnification, or feature height! Using ZYGO’s Coherence Scanning Interferometry (CSI) technology, the NewView™ 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces. Key Features: • Fast non-contact measurements • Sub-angstrom Z resolution • Leading-edge precision & gage capability • Enhanced optical imaging <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/MET-05-300x225.jpg" alt="NewView™ 7300 3D Optical Surface Profiler">
  2. Manufacturer
    Zygo Corporation
  3. Model Number
    NewView 7300
  4. Website(s)
    http://www.nano.upenn.edu/resources/equipmentinstrumentation/
  5. Part of Collection
    Quattrone Nanofabrication Facility
  6. Location
    Singh Center for Nanotechnology (Penn)
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    fcoldren
  3. created
    2016-01-11T16:32:25.630-05:00
  4. creator
    fcoldren
  5. modified
    2016-01-12T09:12:14.696-05:00

Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016