See it in Search
This page is a preview of the following resource. Continue onto eagle-i search using the button on the right to see the full record.
NewView™ 7300 3D Optical Surface Profiler
eagle-i ID
http://eagle-i.itmat.upenn.edu/i/00000152-3298-1ab6-aeee-612f80000000
Resource Type
Properties
-
-
Resource Description
-
The NewView™ 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 10000 µm at high speeds, independent of surface texture, magnification, or feature height!
Using ZYGO’s Coherence Scanning Interferometry (CSI) technology, the NewView™ 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces.
Key Features:
• Fast non-contact measurements
• Sub-angstrom Z resolution
• Leading-edge precision & gage capability
• Enhanced optical imaging
<img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/MET-05-300x225.jpg" alt="NewView™ 7300 3D Optical Surface Profiler">
-
-
Manufacturer
-
Zygo Corporation
-
-
Model Number
-
NewView 7300
-
-
Website(s)
-
http://www.nano.upenn.edu/resources/equipmentinstrumentation/
-
-
Part of Collection
-
Quattrone Nanofabrication Facility
-
-
Location
-
Singh Center for Nanotechnology (Penn)
