NewView™ 7300 3D Optical Surface Profiler

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Resource Type

Properties

1. Resource Description

   The NewView™ 7300 white light interferometer (profilometer) is a powerful tool for characterizing and quantifying surface roughness, step heights, critical dimensions, and other topographical features with excellent precision and accuracy. All measurements are nondestructive, fast, and require no sample preparation. Profile heights ranging from < 1 nm up to 10000 µm at high speeds, independent of surface texture, magnification, or feature height! Using ZYGO’s Coherence Scanning Interferometry (CSI) technology, the NewView™ 7300 3D optical surface profiler easily measures a wide range of surfaces, including smooth, rough, flat, sloped, and stepped surfaces. Key Features: • Fast non-contact measurements • Sub-angstrom Z resolution • Leading-edge precision & gage capability • Enhanced optical imaging <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/MET-05-300x225.jpg" alt="NewView™ 7300 3D Optical Surface Profiler">

2. Manufacturer

   Zygo Corporation

3. Model Number

   NewView 7300

4. Website(s)

   http://www.nano.upenn.edu/resources/equipmentinstrumentation/

5. Part of Collection

   Quattrone Nanofabrication Facility

6. Location

   Singh Center for Nanotechnology (Penn)