FEI Strata DB235 FIB

eagle-i ID

Resource Type

Properties

1. Resource Description

   The FEI Strata DB235 FIB marries a high-resolution field emission SEM with a focused ion beam for precision milling, reactive ion-etching, and ion-assisted deposition with 4 gas injection systems. The FIB platform is upgraded with a nanomanipulator and an in-situ tensile stage, allowing variable temperature observation of nanomechanical properties and providing fundamental insights into work hardening, defect propagation and deformation. An integrated cryogenic stage allows for the ion milling of specimens at temperatures as low as -180°C, enabling the study of materials, such as some polymers, that cannot be milled at room temperature. The FEI FIB bridges the gap between nanocharacterization and nanofabrication by combining a high-resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling, ion-beam assisted material deposition and selective etching. The four gas injection systems will allow for platinum and tungsten deposition, enhanced etching and selective etching of carbon. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/FIB-300x224.jpg" alt="FEI Strata DB235 FIB">

2. Manufacturer

   FEI Company

3. Model Number

   Strata DB235 FIB

4. Website(s)

   http://www.nano.upenn.edu/resources/equipmentinstrumentation/

5. Part of Collection

   Nanoscale Characterization Facility

6. Location

   Singh Center for Nanotechnology (Penn)