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FEI Strata DB235 FIB

eagle-i ID

http://eagle-i.itmat.upenn.edu/i/00000152-32ac-55a1-aeee-612f80000000

Resource Type

  1. Ion source

Properties

  1. Resource Description
    The FEI Strata DB235 FIB marries a high-resolution field emission SEM with a focused ion beam for precision milling, reactive ion-etching, and ion-assisted deposition with 4 gas injection systems. The FIB platform is upgraded with a nanomanipulator and an in-situ tensile stage, allowing variable temperature observation of nanomechanical properties and providing fundamental insights into work hardening, defect propagation and deformation. An integrated cryogenic stage allows for the ion milling of specimens at temperatures as low as -180°C, enabling the study of materials, such as some polymers, that cannot be milled at room temperature. The FEI FIB bridges the gap between nanocharacterization and nanofabrication by combining a high-resolution field-emission scanning electron microscope with a focused ion beam. Uniting these techniques in a single instrument allows users to seamlessly switch from secondary electron imaging to precision ion milling, ion-beam assisted material deposition and selective etching. The four gas injection systems will allow for platinum and tungsten deposition, enhanced etching and selective etching of carbon. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/FIB-300x224.jpg" alt="FEI Strata DB235 FIB">
  2. Manufacturer
    FEI Company
  3. Model Number
    Strata DB235 FIB
  4. Website(s)
    http://www.nano.upenn.edu/resources/equipmentinstrumentation/
  5. Part of Collection
    Nanoscale Characterization Facility
  6. Location
    Singh Center for Nanotechnology (Penn)
 
RDFRDF
 
Provenance Metadata About This Resource Record
  1. workflow state
    Published
  2. contributor
    fcoldren
  3. created
    2016-01-11T16:52:04.427-05:00
  4. creator
    fcoldren
  5. modified
    2016-01-12T09:11:52.123-05:00

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The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016