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Resource Type

  1. Transmission electron microscope


  1. Resource Description
    The JEOL 2010F TEM/STEM is a state-of-the-art field emission transmission electron microscope with capabilities ranging from nanobeam and convergent beam diffraction to high-resolution phase contrast, analytical, and energy filtered imaging. The 2010F has been optimized for analytical microscopy with a large solid angle for high X-ray throughput, scanning, scanning-transmission, and backscattered electron detectors and a Gatan image filter for energy filtered imaging and electron energy loss spectroscopy. This combination of analytical capabilities makes the 2010F an ideal instrument for the characterization of a wide array of samples, yet the 2010F is also a very capable high-resolution instrument for the study of nano-scale materials. The instrument is compatible with a suite of commercial and custom in-situ sample stages. The PRNF maintains a wide range of commercial and custom heating, cooling and in-situ electrical testing holders. Planned purchases of a dual axis electron tomography holder and a cryo-tomography holder will significantly advance capabilities to develop 3D reconstructions of nanomaterials and the distribution of nanomaterials in complex assemblies and in biological hosts. The recent acquisition of a Hysitron PI 95 Picoindentor greatly advances in-situ nanomechanical measurements allowing direct correlation between the application of force and the structural response of materials. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/2010F-300x195.jpg" alt="JEOL 2010F TEM/STEM">
  2. Manufacturer
    JEOL Ltd.
  3. Model Number
  4. Website(s)
  5. Part of Collection
    Nanoscale Characterization Facility
  6. Location
    Singh Center for Nanotechnology (Penn)
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Copyright © 2016 by the President and Fellows of Harvard College
The eagle-i Consortium is supported by NIH Grant #5U24RR029825-02 / Copyright 2016