JEOL 2010F TEM/STEM

eagle-i ID

Resource Type

Properties

1. Resource Description

   The JEOL 2010F TEM/STEM is a state-of-the-art field emission transmission electron microscope with capabilities ranging from nanobeam and convergent beam diffraction to high-resolution phase contrast, analytical, and energy filtered imaging. The 2010F has been optimized for analytical microscopy with a large solid angle for high X-ray throughput, scanning, scanning-transmission, and backscattered electron detectors and a Gatan image filter for energy filtered imaging and electron energy loss spectroscopy. This combination of analytical capabilities makes the 2010F an ideal instrument for the characterization of a wide array of samples, yet the 2010F is also a very capable high-resolution instrument for the study of nano-scale materials. The instrument is compatible with a suite of commercial and custom in-situ sample stages. The PRNF maintains a wide range of commercial and custom heating, cooling and in-situ electrical testing holders. Planned purchases of a dual axis electron tomography holder and a cryo-tomography holder will significantly advance capabilities to develop 3D reconstructions of nanomaterials and the distribution of nanomaterials in complex assemblies and in biological hosts. The recent acquisition of a Hysitron PI 95 Picoindentor greatly advances in-situ nanomechanical measurements allowing direct correlation between the application of force and the structural response of materials. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/2010F-300x195.jpg" alt="JEOL 2010F TEM/STEM">

2. Manufacturer

   JEOL Ltd.

3. Model Number

   2010F

4. Website(s)

   http://www.nano.upenn.edu/resources/equipmentinstrumentation/

5. Part of Collection

   Nanoscale Characterization Facility

6. Location

   Singh Center for Nanotechnology (Penn)