JEOL 2100 HRTEM

eagle-i ID

Resource Type

Properties

1. Resource Description

   The JEOL 2100 Transmission Electron Microscope (TEM) is available for both conventional and high resolution TEM imaging. It is equipped with single tilt, double-tilt, heating and cooling sample holders for a wide range of imaging experiments. The analytical objective lens pole piece on this microscope allows for sample tilting up to 33 degrees, yet maintains a point-to-point resolution of 0.25 nm. In addition to the conventional plate camera, this microscope is equipped with a Gatan Peltier cooled CCD imaging system for high quality digital imaging and video streaming. <img src="http://www.nano.upenn.edu/wp-content/uploads/2014/09/2100-300x300.jpg" alt="JEOL 2100 HRTEM">

2. Manufacturer

   JEOL Ltd.

3. Model Number

   2100

4. Website(s)

   http://www.nano.upenn.edu/resources/equipmentinstrumentation/

5. Part of Collection

   Nanoscale Characterization Facility

6. Location

   Singh Center for Nanotechnology (Penn)